Measurement Techniques for Radio Frequency Nanoelectronics (Hardcover)
 
作者: T Mitch Wallis 
分類: Microwave technology  
書城編號: 1340119


售價: $1568.00

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出版社: Cambridge University Press
出版日期: 2017/09/14
尺寸: 248x179x19mm
重量: 788 grams
ISBN: 9781107120686

商品簡介
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. - Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides - Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy - Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
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