Reliability and Materials Issues of III-V and II-VI Semicond (Hardcover)
 
作者: Osamu Ueda 
書城編號: 901817


售價: $880.00

抱歉! 此商品已售罄, 不能訂購

如此商品日後有貨, 請通知我, 我的電郵/用戶名稱是:
 
 
出版社: Cambridge University Press
出版日期: 2012/08/27
尺寸: 0x0x0mm
重量: 0.52 kg
ISBN: 9781605114095

商品簡介
Symposium G, "Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II," was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California. Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes.
Osamu Ueda 作者作品表

Reliability and Materials Issues of III-V and II-VI Semicond (Hardcover)

Reliability and Degradation of III-V Optical Devices (Hardcover)

* 以上資料僅供參考之用, 香港書城並不保證以上資料的準確性及完整性。
* 如送貨地址在香港以外, 當書籍/產品入口時, 顧客須自行繳付入口關稅和其他入口銷售稅項。

 

 

 

  我的賬戶 |  購物車 |  出版社 |  團購優惠
加入供應商 |  廣告刊登 |  公司簡介 |  條款及細則

香港書城 版權所有 私隱政策聲明

顯示模式: 電腦版 (改為: 手機版)