Full Field Optical Metrology Applications (Hardcover)
 
作者: Fernando Mendoza-Santoyo 
分類: Optical physics  
書城編號: 23742481


售價: $1680.00

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出版社: Iop Publ Ltd
出版日期: 2022/10/31
ISBN: 9780750330251

商品簡介


Full Field Optical Metrology methods and techniques have been in existence since the first interferometry experiments by Thomas Young in the 19th Century. This book introduces non-contact optical techniques based on the speckle effect in more detail. It also covers surface metrology and explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moir

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